BioEnergy Science Center 2007-2017

Intellectual Property Available for Licensing

Mode-synthesizing Atomic Force Microscopy (MSAFM) and Mode-Synthesizing Sensing (MSS)

The invention allows for the physical/mechanical, and chemical, nanoscale features of various material samples to be measured. The invention provides nanoscale surface as well as subsurface information. With high resolution, the subsurface material such as embedded nanoparticles or other material inhomogeneities can be resolved with a resolution comparable to other existing atomic force microscopy-based approaches.

Inventors

• Passian, Ali (2 technologies)
• Tetard, Laurene (2 technologies)
• Thundat, Thomas (2 technologies)

ID: ID 2253

License Status

• Available For Licensing

Inventoring Institution

• Oak Ridge National Laboratory
• University of Tennessee

Licensing Opportunity
For more information about this technology, please contact Brian Davison at Oak Ridge, TN.

Brian Davison
IP Coordinator (acting)
Office: 865-574-0955
Mobile: 865-386-6096
davisonbh@ornl.gov